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Secondary Ion Mass Spectroscopy of Solid Surfaces

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Secondary Ion Mass Spectroscopy of...

Secondary Ion Mass Spectroscopy of Solid Surfaces

V. T. Cherepin (Editor)

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Kategoriler:

Yıl:

1987

Baskı:

1

Yayımcı:

CRC Press

Dil:

english

ISBN 10:

1466563737

ISBN 13:

9789067640787

Dosya:

PDF, 34.15 MB

IPFS:

,

english, 1987

Online Oku

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dosyasına dönüştürme başarısız oldu

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Paul van der Heide — Secondary Ion Mass Spectrometry: An Introduction to Principles and Practices

Fred Stevie — Secondary ion mass spectrometry : applications for depth profiling and surface characterization

John H. Thomas III (auth.), Alvin W. Czanderna, Theodore E. Madey, Cedric J. Powell (eds.) — Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis

Charles Evans, Richard Brundle, Wilson — Encyclopedia of Materials Characterization: Surfaces, Interfaces, Thin Films (Materials Characterization Series)

C. Richard Brundle; Charles A. Evans, Jr.; Shaun Wilson — Encyclopedia of Materials Characterization

Rainer Behrisch (auth.), Dr. Rainer Behrish (eds.) — Sputtering by Particle Bombardment II: Sputtering of Alloys and Compounds, Electron and Neutron Sputtering, Surface Topography

Hubert Gnaser (auth.) — Low-Energy Ion Irradiation of Solid Surfaces

Brundle, C.Richard; Evans, Charles A. Jr.; Wilson, Shaun(eds.) — Encyclopedia of Materials Characterization - Surfaces, Interfaces, Thin Films

P. W. Hawkes — Advances in Electronics and Electron Physics.

N. Tolk (Eds.) — Inelastic Ion–Surface Collisions

John H. Thomas III (auth.), Alvin W. Czanderna, Theodore E. Madey, Cedric J. Powell (eds.) — Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis

R. Behrisch — Sputtering by Particle Bombardment I: Physics and Applications

A.W. Czanderna (Eds.) — Methods of Surface Analysis

John C. Vickerman, Ian Gilmore — Surface Analysis - The Principal Techniques

John C. Vickerman, Ian Gilmore — Surface Analysis: The Principal Techniques

R. Kenneth Marcus, José A. C. Broekaert — Glow Discharge Plasmas in Analytical Spectroscopy

Dominic M. Desiderio, Nico M. M. Nibbering, Joseph A. Loo(eds.) — Cluster Secondary Ion Mass Spectrometry: Principles and Applications

Charles Evans, Richard Brundle, Wilson — Encyclopedia of Materials Characterization: Surfaces, Interfaces, Thin Films

Jerome J. Cuomo — Handbook of Ion Beam Processing Technology: Principles, Depostion, Film Modification and Synthesis (Materials Science & Process Technology S.) (Materials Science and Process Technology)

McGuire G. E. (ed.) — Characterization Of Semiconductor Materials

Philip A. Lyon (Eds.) — Desorption Mass Spectrometry. Are SIMS and FAB the Same?

H. H. Andersen, J. Bøttiger and H. Knudsen (Eds.) — Ion Beam Analysis. Proceedings of the Fourth International Conference on Ion Beam Analysis, Aarhus, June 25–29, 1979

Ubai A. Arifov (auth.) — Interaction of Atomic Particles with a Solid Surface / Vzaimodeistvie Atomnykh Chastits S Poverkhnost’yu Tverdogo Tela / Взаимодействие Атомных Частиц С Поверхностью Твердого Тела

Professor D. M. Hercules (auth.), Prof. Dr. M. Grasserbauer, W. Wegscheider (eds.) — Progress in Materials Analysis: Vol. 2

Bernd Schmidt, Klaus Wetzig — Ion beams in materials processing and analysis

Henning Bubert, Holger Jenett — Surface and thin film analysis: principles, instrumentation, applications

Hubert Gnaser — Low Energy Ion Irradiation of Solid Surfaces

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